Requirements
| Product | Specification/mm |
| Ho: YLF | Dimension: φ3*30mm |
Process Indicators
- Material: Ho:YLF Crystal
- Dimension: φ3×30 mm
- Orientation: a-cut
- Doping: 1%
- Coating: AR/AR@1900-2100 nm on both faces
- Damage threshold: ˃10J/cm2@2050 nm, 10ns
- Orientation Tolerence: < 0.5°
- Thickness/Diameter Tolerance: ±0.1 mm
- Surface Flatness: <λ/8@632 nm
- Wavefront Distortion (WFD): <λ/4@632 nm
- Surface Quality: 20/10
- Parallel: 30〞
- Perpendicular: 15ˊ
- Clear Aperture: >90%
- Chamfer: <0.2×45°
Pictures
